Sunday, May 30, 2004

Paper review: Gerchberg71Phase

[abstract] This paper presents a system of quadratic equations which enables the phase distribution in both the diffraction and image planes to be determined quantitatively. The required data for this system of equations are the intensities of the waves in the diffraction and image planes. Alought the phases cannot be directly recorded at these planes, the intensity distributions contain all the information needed for obtaining the complete wave function.

Journal = {Optik},
Year = {1971},
Title = {Phase Determination from Image and Diffraction Plane Pictures in the Electron Microscope},
Number = {3},
Pages = {275-284},
Author = {R.W. Gerchberg and W.O. Saxton},
Volume = {34}}

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